Description
hardware flow control. It is an ideal choice in the field of industrial automation.
(5) Perform predictive maintenance, analyze machine operating conditions, determine the main
causes of failures, and predict component failures to avoid unplanned downtime.
Traditional quality improvement programs include Six Sigma, Deming Cycle, Total Quality Management (TQM), and Dorian Scheinin’s
Statistical Engineering (SE) [6]. Methods developed in the 1980s and 1990s are typically applied to small amounts
of data and find univariate relationships between participating factors. The use of the MapReduce paradigm to simplify data processing in
large data sets and its further development have led to the mainstream proliferation of big data analytics [7]. Along with the development of
machine learning technology, the development of big data analytics has provided a series of new tools that can be applied to manufacturing
analysis. These capabilities include the ability to analyze gigabytes of data in batch and streaming modes, the ability to find complex multivariate
nonlinear relationships among many variables, and machine learning algorithms that separate causation from correlation.
Millions of parts are produced on production lines, and data on thousands of process and quality measurements are collected for them, which is
important for improving quality and reducing costs. Design of experiments (DoE), which repeatedly explores thousands of causes through
controlled experiments, is often too time-consuming and costly. Manufacturing experts rely on their domain knowledge to detect key
factors that may affect quality and then run
DoEs based on these factors. Advances in big data analytics and machine learning enable the detection of critical factors that effectively
impact quality and yield. This, combined with domain knowledge, enables rapid detection of root causes of failures. However,
there are some unique data science challenges in manufacturing.
(1) Unequal costs of false alarms and false negatives. When calculating accuracy, it must be recognized that false alarms
and false negatives may have unequal costs. Suppose a false negative is a bad part/instance that was wrongly predicted to
be good. Additionally, assume that a false alarm is a good part that was incorrectly predicted as bad. Assuming further that
the parts produced are safety critical, incorrectly predicting that bad parts are good (false negatives) can put human lives
at risk. Therefore, false negatives can be much more costly than false alarms. This trade-off needs to be considered when
translating business goals into technical goals and candidate evaluation methods.
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https://www.xmamazon.com
https://www.plcdcs.com/
www.module-plc.com/
https://www.ymgk.com
ABB PFXA401F 3BSE024388R3
ABB junction box 3BSE029997R1
ABB junction box PFXC141
ABB PFXC141 3BSE029997R1
ABB operating unit 3BSE017235R1
ABB PXAH401 operating unit
ABB PXAH401 3BSE017235R1
ABB Thyristor 3BHL000986P0006
ABB Thyristor D1031SH45TS02
ABB Thyristor D1961SH45TS02
ABB 3BHB009885R0004 IGCT framework
ABB S-093H IGCT framework
ABB S-093H 3BHB009885R0004
ABB IGCT framework 3BHB018008R0003
ABB IGCT framework S-113H
ABB S-113H 3BHB018008R0003
HITACHI 2-822037-A
HITACHI LBT010A
HITACHI LCE250B
HITACHI LPA210A
HITACHI LPA220A
HITACHI LPA245A
HITACHI LPA302A
HITACHI LPA302P-1
HITACHI LPD220A
HITACHI LPD250A
HITACHI LPD350A
HITACHI LPF240A
HITACHI LPF240F
HITACHI LPP100A
HITACHI LPT020A
HITACHI LPU100A
HITACHI LPU100H
HITACHI LUD060A
HITACHI LUD700A
HITACHI LYA010A
HITACHI LYA100A
HITACHI LYA210A
HITACHI LYA220A
HITACHI LYD000A
HITACHI LYD105A
HITACHI LYT000A
HITACHI MPD060A
HITACHI MPD110A
HITACHI MPD310A
HITACHI PS6000
HITACHI PS6515
HITACHI PS6524
HITACHI PS6548
HITACHI TD000A
TERASAKI EGS-112A MAC-2S
TELEMECANIQUE-SCHNEIDER ELECTRIC TSX MICRO-TSX3722101
YAMATAKE J-SSP50-22
YAMATAKE J-SSP50-21
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