Description
Module Type:Mixed Signal I/O
Compatibility:PXI Express
Analog Input Channels:8
Resolution (Bits):16
Sampling Rate (MS/s):25
Voltage Range (V):+/-10
Digital I/O Channels:8
Connectors:High-density Lemo connectors
Power Requirements:12 V DC
The NI PXIe-4304 combines exceptional performance with flexibility and reliability. Its high-speed digital pattern generation capabilities make it an ideal solution for semiconductor test systems and automated test equipment. With its up to 64-bit resolution and sampling rates of up to 1 GS/s per channel, this module supports a wide range of applications from basic signal generation to complex pattern analysis. The 4-channel configuration allows for parallel testing, enhancing efficiency and throughput. Featuring a ±10V voltage range and a timing resolution down to 64 ps, it ensures precise measurements even in demanding environments. Compatible with PCI Express interface, the PXIe-4304 integrates seamlessly with existing test systems. Additionally, its robust design supports operating temperatures ranging from -10°C to +55°C, making it suitable for various industrial settings.
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